Hardback (01 Jan 1988)
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Papers of the International Workshop on Designing for Yield, Oxford, July 1987. Objectives include discussion of topics in VLSI and designing integrated circuits to yield targets. On yield loss mechanisms and defect tolerance, alternative prospects, catastrophic yield loss models, parametric yield loss, defect-tolerant architectures, yield predicti
| ISBN: | 9780852743980 |
| Publisher: | Taylor and Francis |
| Imprint: | CRC Press |
| Pub date: | 01 Jan 1988 |
| DEWEY: | 621.38173 |
| DEWEY edition: | 19 |
| Language: | English |
| Number of pages: | 304 |
| Weight: | -1g |
| Height: | 230mm |
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