Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing, 28-29 July, 2003, San Jose, California
Book (31 Dec 2003)
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Includes delivery to the United States
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Book information
| ISBN: | 9780769520049 |
| Publisher: | IEEE Computer Society |
| Imprint: | IEEE Computer Society |
| Pub date: | 31 Dec 2003 |
| DEWEY: | 621.39732 |
| DEWEY edition: | 22 |
| Language: | English |
| Number of pages: | 95 |
| Weight: | -1g |
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