Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks

Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks 21-22 July 1999, Denver, Colorado - SPIE Proceedings Series

Paperback (31 Oct 1999)

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Book information

ISBN: 9780819432926
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 621.39767
DEWEY edition: 21
Number of pages: 182
Weight: -1g
Height: 280mm