Publisher's Synopsis
This volume contains the conference proceedings of the 2001 IEEE International Workshop on Memory Technology, Design and Testing.
Proceedings 2001 IEEE International Workshop on Memory Technology, Design, and Testing : August 6-7, 2001, San Jose, California
Book (30 Sep 2001)
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Includes delivery to the United States
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Book information
| ISBN: | 9780769512426 |
| Publisher: | IEEE Computer Society |
| Imprint: | IEEE Computer Society |
| Pub date: | 30 Sep 2001 |
| DEWEY: | 621.39732 |
| DEWEY edition: | 21 |
| Language: | English |
| Number of pages: | 108 |
| Weight: | -1g |
| Height: | 230mm |
| Width: | 209mm |
| Spine width: | 2mm |
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