Mixed-Signal Generic Testing in Photonic Integration

Mixed-Signal Generic Testing in Photonic Integration - Synthesis Lectures on Digital Circuits and Systems

Hardback (02 Aug 2024)

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Publisher's Synopsis

This book describes testing methods for Novel Photonic Integrated Circuits, which have become one of the hottest topics in the context of information technology. Readers will learn that these objects are used not only to enhance the throughput of optical communications (backbone of the internet network), but also to for smart-sensing, metrology, quantum application and artificial intelligence. The increasing demand for this kind of device drives the need for fast and effective testing methods, as described in this book.

Book information

ISBN: 9783031608100
Publisher: Springer Nature Switzerland
Imprint: Springer
Pub date:
DEWEY: 621.365
DEWEY edition: 23
Language: English
Number of pages: 148
Weight: 522g
Height: 240mm
Width: 168mm
Spine width: 15mm