Publisher's Synopsis
A collection of 43 papers on machine vision systems for inspection and metrology. Topics covered include the systems themselves, components within the systems and applications for them.
Machine Vision Systems for Inspection and Metrology VII 4-5 November, 1998, Boston, Massachusetts - Proceedings of SPIE
Paperback (31 May 1999)
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Book information
| ISBN: | 9780819429827 |
| Publisher: | SPIE |
| Imprint: | SPIE |
| Pub date: | 31 May 1999 |
| DEWEY: | 670.425 |
| DEWEY edition: | 21 |
| Language: | English |
| Number of pages: | 386 |
| Weight: | -1g |
| Height: | 230mm |
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