Paperback (30 Nov 2000)
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This work constitutes the proceedings of the 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2000). Subjects addressed include: yield analysis and modelling; wafer scale/large area systems; fault-tolerant systems; tesitng strategies; and more.
| ISBN: | 9780769507194 |
| Publisher: | I.E.E.E.Press |
| Imprint: | I.E.E.E.Press |
| Pub date: | 30 Nov 2000 |
| Language: | English |
| Number of pages: | 438 |
| Weight: | -1g |
| Height: | 222mm |
| Width: | 152mm |
| Spine width: | 25mm |
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