Paperback (31 May 2000)
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These papers constitute the proceedings of the IEEE VLSI Test Symposium 2000. Subjects covered include: microprocessor test/validation; low power BIST and scan; defect driven techniques; analogue test techniques; temperature and process drift issues; and more.
| ISBN: | 9780769506135 |
| Publisher: | I.E.E.E.Press |
| Imprint: | I.E.E.E.Press |
| Pub date: | 31 May 2000 |
| DEWEY: | 621.395 |
| Language: | English |
| Number of pages: | 500 |
| Weight: | 1202g |
| Height: | 266mm |
| Width: | 209mm |
| Spine width: | 25mm |
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