Book (31 Oct 1995)
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This annual workshop serves as a forum for the exchange of ideas on semiconductor memories design and testing. The proceedings of the 1995 workshop include a tutorial session (testing random access memories) and 18 papers in six technical sessions: role of simulation in memory design; bridging faults and I D D Q testing; memory built-in self-test;
| ISBN: | 9780818671029 |
| Publisher: | IEEE Computer Society Press |
| Imprint: | IEEE Computer Society Press |
| Pub date: | 31 Oct 1995 |
| DEWEY: | 621.39732 |
| DEWEY edition: | 21 |
| Language: | English |
| Number of pages: | 129 |
| Weight: | -1g |
| Height: | 279mm |
| Width: | 215mm |
| Spine width: | 12mm |
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