Hardback (31 Jan 1999)
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ITC is a technical conference on the testing and total quality of integrated electronic circuits, and the assemblies and systems that are based on them. This is a collection of papers covering topics such as; dynamic current testing; MCM systems design; memory test; and unpowered opens.
| ISBN: | 9780780350922 |
| Publisher: | International Test Conference |
| Imprint: | International Test Conference |
| Pub date: | 31 Jan 1999 |
| DEWEY: | 621.381548 |
| DEWEY edition: | 21 |
| Language: | English |
| Number of pages: | 1179 |
| Weight: | -1g |
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