Publisher's Synopsis
The second volume in this comprehensive two-volume series provides information, procedures, tests and illustrations helping engineers analyze time-to-failure data to ensure greater reliability in the products they design. Volume II includes up-to-date information on Accept-Reject tests, the Sequential Probability Radio Test, Bayesian MTBF and Reliability Demonstration Tests, as well as some very important accelerated tests including Arrhenius, Eyriing, Bazovsky, Inverse Power Law and many others. It also offers sections on reliability growth monitoring techniques and property testing methods for establishing MTBF or reliability with the desired accuracy and confidence level.
