X-Ray Diffraction by Disordered Lamellar Structures

X-Ray Diffraction by Disordered Lamellar Structures Theory and Applications to Microdivided Silicates and Carbons

Hardback (02 Nov 1990) | German

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Publisher's Synopsis

New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.

Book information

ISBN: 9783540512226
Publisher: Springer Berlin Heidelberg
Imprint: Springer
Pub date:
DEWEY: 549
Language: German
Number of pages: 371
Weight: 725g
Height: 240mm
Width: 155mm