X-Ray Diffraction by Disordered Lamellar Structures : Theory and Applications to Microdivided Silicates and Carbons

X-Ray Diffraction by Disordered Lamellar Structures : Theory and Applications to Microdivided Silicates and Carbons

Softcover reprint of the original 1st Edition 1990

Paperback (13 Dec 2011)

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Publisher's Synopsis

New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.

Book information

ISBN: 9783642748042
Publisher: Springer Berlin Heidelberg
Imprint: Springer
Pub date:
Edition: Softcover reprint of the original 1st Edition 1990
Language: English
Number of pages: 371
Weight: 593g
Height: 234mm
Width: 156mm
Spine width: 20mm