Twentieth annual IEEE Semiconductor Thermal Measurement and Management Symposium : proceedings 2004, San Jose, CA, USA, March 9-

Twentieth annual IEEE Semiconductor Thermal Measurement and Management Symposium : proceedings 2004, San Jose, CA, USA, March 9-

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Book information

ISBN: 9780780383630
Publisher: IEEE Press/IEEE Service Ctr
Pub date:
Number of pages: 313 p.