Publisher's Synopsis
This text covers the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of diffraction patterns. It also describes unique aspects of each technique, especially imaging and spectroscopy in the TEM. The textbook thoroughly develops both introductory and advanced-level material, using over 400 accompanying illustrations. Problems are provided at the end of each chapter to reinforce key concepts. Simple citatioins of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail.
