Publisher's Synopsis
This book describes a methodology of fault location in dynamic systems. A variety of techniques is presented, in both the time and frequency domains: reference is made to the pattern recognition methods based on probabilistic theory. However, as their large data demand precludes their use in many industrial situations, the text develops strategies, of a pattern recognition nature, that recognize the need for cost-effective time and data processing. The efficiency of dynamic as opposed to static texts is emphasised, and guidelines are given to establish system checkout tolerancing in both time and frequency domains. Included is the automation of test program generation which enables the selection of optimum measurements to be made.
