Three-Dimensional and Multidimensional Microscopy

Three-Dimensional and Multidimensional Microscopy Image Acquisition and Processing XI : 27-29 January 2004, San Jose, California, USA - Proceedings of SPIE;

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Publisher's Synopsis

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Book information

ISBN: 9780819452320
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 570.282
DEWEY edition: 22
Language: English
Number of pages: 276
Weight: 657g
Height: 266mm
Width: 209mm
Spine width: 19mm