Three-Dimensional and Multidimensional Microscopy

Three-Dimensional and Multidimensional Microscopy Image Acquisition and Processing X : 28-29 January 2003, San Jose, California, USA - Proceedings of SPIE;

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Book information

ISBN: 9780819447647
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 570.282
DEWEY edition: 22
Language: English
Number of pages: 168
Weight: -1g