Thermal Conductivity Measurements in Atomically Thin Materials and Devices. Nanoscience and Nanotechnology

Thermal Conductivity Measurements in Atomically Thin Materials and Devices. Nanoscience and Nanotechnology - SpringerBriefs in Applied Sciences and Technology

1st Edition 2020

Paperback (20 May 2020)

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Publisher's Synopsis

This book assesses the thermal feasibility of using materials with atomically thin layers such as graphene and the transition metal dichalcogenides family in electronics and optoelectronics applications. The focus is on thermal conductivity measurement techniques currently available for the investigation of thermal performance at the material and device level. In addition to providing detailed information on the available techniques, the book introduces readers to novel techniques based on photothermal effects. 

Book information

ISBN: 9789811553479
Publisher: Springer Nature Singapore
Imprint: Springer
Pub date:
Edition: 1st Edition 2020
Language: English
Number of pages: 50
Weight: 109g
Height: 235mm
Width: 155mm
Spine width: 4mm