The Physics and Chemistry of SiOb2s and the Si-SiOb2s Interface--4, 2000

The Physics and Chemistry of SiOb2s and the Si-SiOb2s Interface--4, 2000 Proceedings of the Fourth International Symposium on the Physics and Chemistry of SiOb2s and the Si-SiOb2s Interface, Toronto, Canada, May 15-18, 2000 - Proceedings

Book (01 Jan 2000)

Not available for sale

Includes delivery to the United States

Out of stock

This service is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Publisher's Synopsis

Contributors from around the globe present 51 papers covering a variety of topics associated with SiO 2 and Si-SiO 2 interface. The Plenary session focused on aspects of the manufacturing and limits of SiO 2-based dielectrics used in CMOS applications. Other sessions revolved around oxide technology; research results in the area of oxynitrides and

Book information

ISBN: 9781566772679
Publisher: Electrochemical Society
Imprint: Electrochemical Society
Pub date:
DEWEY: 546.6832
DEWEY edition: 21
Language: English
Number of pages: 539
Weight: 1156g
Height: 266mm
Width: 184mm
Spine width: 25mm