Publisher's Synopsis
This is the first comprehensive and unified treatment to describe the physical principles behind experimental techniques used for measuring the electrical properties of semiconductors. The principles involved are illustrated by reference to selected examples drawn from the world of semiconductor materials.;By concentrating on the physical principles of each technique and enumerating its inherent limitations, the authors have produced a text which should be helpful in solving a variety of problems in semiconductor characterization and one which will not be overtaken quickly by development in the materials themselves.
