null (31 Mar 2000)
Not available for sale
Includes delivery to the United States
Out of stock
This videotaped tutorial begins by reviewing historic trends in CMOS device scaling and identifying the characteristics and requirements of sub-100nm transistors, including both device and circuit considerations, and gate oxide scaling and scaling source/drain regions and optimizing well profiles.
| ISBN: | 9780780361386 |
| Publisher: | I.E.E.E.Press |
| Imprint: | I.E.E.E.Press |
| Pub date: | 31 Mar 2000 |
| Language: | English |
| Weight: | -1g |
$3.96off
Paperback
Published 21 Jun 2018
Save $3.96
$10.43off
Hardback
Published 24 Aug 2023
Save $10.43
$7.84off
Hardback
Published 29 Sep 2023
Save $7.84
