Standards for Electronic Imaging Technologies, Devices, and Systems

Standards for Electronic Imaging Technologies, Devices, and Systems Proceedings of a Conference Held 1-2 February 1996, San Jose, California - Critical Reviews of Optical Science and Technology

Paperback (30 Jun 1996)

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    Publisher's Synopsis

    Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

    Book information

    ISBN: 9780819420169
    Publisher: SPIE
    Imprint: SPIE
    Pub date:
    DEWEY: 621.3827
    DEWEY edition: 20
    Language: English
    Number of pages: 276
    Weight: 494g
    Height: 254mm
    Width: 178mm
    Spine width: 16mm

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