Silicon-Based Millimetre-Wave Technology

Silicon-Based Millimetre-Wave Technology Measurement, Modeling and Applications - Advances in Imaging and Electron Physics

Hardback (31 Dec 2012)

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Publisher's Synopsis

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Book information

ISBN: 9780123942982
Publisher: Elsevier Science
Imprint: Academic Press
Pub date:
DEWEY: 621.384
DEWEY edition: 23
Language: English
Number of pages: 484
Weight: 760g
Height: 229mm
Width: 152mm
Spine width: 31mm