Secondary Ion Mass Spectrometry Sims II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (Sims II) Stanford Univ

Secondary Ion Mass Spectrometry Sims II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (Sims II) Stanford Univ - Springer Series in Chemical Physics

Softcover reprint of the original 1st Edition 1979

Paperback (13 Dec 2011)

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Book information

ISBN: 9783642618734
Publisher: Springer Berlin Heidelberg
Imprint: Springer
Pub date:
Edition: Softcover reprint of the original 1st Edition 1979
Language: English
Number of pages: 300
Weight: 466g
Height: 229mm
Width: 152mm
Spine width: 17mm