Scanning Electron Microscopy and X-Ray Microanalysis

Scanning Electron Microscopy and X-Ray Microanalysis Third Edition

3rd Edition 2003rd Softcover reprint of the original 3rd Edition 2003

Paperback (31 May 2013) | English

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Synopsis

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.

Book information

ISBN: 9781461349693
Publisher: Springer US
Imprint: Springer
Pub date:
Edition: 3rd Edition 2003rd Softcover reprint of the original 3rd Edition 2003
Language: English
Number of pages: 689
Weight: 1310g
Height: 182mm
Width: 255mm
Spine width: 43mm