Second revised and updated edition
Paperback (01 Dec 2010)
Includes delivery to the United States
10+ copies available online - Usually dispatched within 7 days
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
| ISBN: | 9783642083723 |
| Publisher: | Springer Berlin Heidelberg |
| Imprint: | Springer |
| Pub date: | 01 Dec 2010 |
| Edition: | Second revised and updated edition |
| DEWEY: | 502.825 |
| DEWEY edition: | 23 |
| Language: | English |
| Number of pages: | 529 |
| Weight: | 844g |
| Height: | 161mm |
| Width: | 241mm |
| Spine width: | 33mm |
$0.98off
Paperback
Published 01 Nov 2018
Save $0.98
$4.10off
Paperback
Published 07 May 2015
Save $4.10
$3.80off
Paperback
Published 18 Jun 1998
Save $3.80
$58.12off
Hardback
Published 01 Nov 1999
Save $58.12
$171.02off
Hardback
Published 03 Jun 2021
Save $171.02
