Scanned Probe Microscopy

Scanned Probe Microscopy Santa Barbara, CA, 1991 - AIP Conference Proceedings

Hardback (20 Mar 1998)

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Book information

ISBN: 9780883188163
Publisher: American Institute of Physics
Imprint: American Inst. of Physics
Pub date:
DEWEY: 502.825
DEWEY edition: 20
Language: English
Number of pages: 563
Weight: 550g
Height: 230mm
Width: 150mm
Spine width: 35mm