SAR Image Analysis, Modeling, and Techniques VI

SAR Image Analysis, Modeling, and Techniques VI 8 September, 2003, Barcelona, Spain - SPIE Proceedings Series

Paperback (31 Dec 2003)

Not available for sale

Includes delivery to the United States

Out of stock

This service is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Publisher's Synopsis

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Book information

ISBN: 9780819451194
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 621.3678
DEWEY edition: 22
Language: English
Number of pages: 210
Weight: 521g
Height: 266mm
Width: 209mm
Spine width: 12mm