Reliability and Yield Problems of Wire Bonding in Microelectronics

Reliability and Yield Problems of Wire Bonding in Microelectronics The Application of Materials and Interface Science

Book (01 Jan 1989)

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Book information

ISBN: 9780930815257
Publisher: International Society for Hybrid Microelectronics
Imprint: International Society for Hybrid Microelectronics
Pub date:
DEWEY: 621.3815
DEWEY edition: 20
Language: English
Number of pages: 202
Weight: 476g
Height: 234mm
Width: 158mm
Spine width: 19mm