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Reduction of JFET Parameter Drift in IC Operational Amplifiers Using Statistical Process Characterization

Reduction of JFET Parameter Drift in IC Operational Amplifiers Using Statistical Process Characterization

Paperback (01 Jan 1993)

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Book information

ISBN: 9780201634297
Publisher: Addison-Wesley
Imprint: Addison-Wesley
Pub date:
DEWEY: 621.395
DEWEY edition: 20
Number of pages: 24
Weight: -1g
Height: 240mm

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