Book (31 Oct 1993)
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From the August 1993 workshop in San Jose, California, 26 papers report the latest findings on testing computer memory. The sections include test pattern generation, algorithms, fault models, testing for process defects and yield improvement, and radiation issues and space applications. No subject i
| ISBN: | 9780818641503 |
| Publisher: | IEEE Computer Society Press |
| Imprint: | IEEE Computer Society Press |
| Pub date: | 31 Oct 1993 |
| DEWEY: | 621.397320287 |
| DEWEY edition: | 20 |
| Language: | English |
| Number of pages: | 143 |
| Weight: | -1g |
| Height: | 279mm |
| Width: | 215mm |
| Spine width: | 12mm |
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