Process Control and Diagnostics

Process Control and Diagnostics 18-19 September 2000, Santa Clara, USA - SPIE Proceedings Series

Paperback (30 Jun 2006)

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Book information

ISBN: 9780819438430
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 670.427
DEWEY edition: 21
Language: English
Number of pages: 374
Weight: 885g
Height: 267mm
Width: 203mm
Spine width: 19mm