Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Paperback (31 Mar 1996)
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Book information
| ISBN: | 9780780327979 |
| Publisher: | Institute of Electrical and Electronics Engineers |
| Imprint: | Institute of Electrical and Electronics Engineers |
| Pub date: | 31 Mar 1996 |
| DEWEY: | 621.3815 |
| DEWEY edition: | 20 |
| Language: | English |
| Number of pages: | 230 |
| Weight: | -1g |
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