Physical Principles of Electron Microscopy

Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM

1st ed. 2005. Corr. 2nd printing 2011

Hardback (03 Aug 2005)

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Publisher's Synopsis

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

Book information

ISBN: 9780387258003
Publisher: Springer US
Imprint: Springer
Pub date:
Edition: 1st ed. 2005. Corr. 2nd printing 2011
Language: English
Number of pages: 202
Weight: 1060g
Height: 234mm
Width: 156mm
Spine width: 14mm