Photo-Induced Defects in Semiconductors

Photo-Induced Defects in Semiconductors - Cambridge Studies in Semiconductor Physics and Microelectronic

Paperback (09 Mar 2006)

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Publisher's Synopsis

This is the first book to give a complete overview of the properties of deep-level, localized defects in semiconductors. Such comparatively long-lived (or metastable) defects exhibit complex interactions with the surrounding material, and can significantly affect the performance and stability of certain semiconductor devices. After an introductory discussion of metastable defects, the properties of DX and EL2 centres in III-V compounds are presented. Additional crystalline materials are also dealt with, before a detailed description is given of the properties and kinetics of photo-induced defects in amorphous semiconductors. The book closes with an examination of the effects of photo-induced defects in a range of practical applications. Throughout, unifying concepts and models are stressed, and the book will be of great use to graduate students and researchers interested in the physics and materials science of semiconductors.

Book information

ISBN: 9780521024457
Publisher: Cambridge University Press
Imprint: Cambridge University Press
Pub date:
DEWEY: 537.622
DEWEY edition: 20
Language: English
Number of pages: 232
Weight: 350g
Height: 229mm
Width: 152mm
Spine width: 14mm