Pattern Detection and Discovery

Pattern Detection and Discovery ESF Exploratory Workshop, London, UK, September 16-19, 2002 : Proceedings - Lecture Notes in Computer Science

2002

Paperback (04 Sep 2002)

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Publisher's Synopsis

Book information

ISBN: 9783540441489
Publisher: Springer Berlin Heidelberg
Imprint: Springer
Pub date:
Edition: 2002
DEWEY: 006.4
DEWEY edition: 21
Language: English
Number of pages: 226
Weight: 348g
Height: 234mm
Width: 156mm
Spine width: 13mm