Optical System Alignment, Tolerancing and Verification VII

Optical System Alignment, Tolerancing and Verification VII 25-26 August, 2013, San Diego, California, United States - Proceedings of SPIE

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Publisher's Synopsis

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Book information

ISBN: 9780819496942
Publisher: SPIE
Imprint: SPIE
Pub date:
Language: English
Number of pages: 277
Weight: 444g
Height: 281mm
Width: 223mm
Spine width: 14mm