Nanophotonics, Nanostructure, and Nanometrology

Nanophotonics, Nanostructure, and Nanometrology 8-10 November 2004, Beijing, China - Proceedings of SPIE

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Publisher's Synopsis

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Book information

ISBN: 9780819455901
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 620.5
DEWEY edition: 22
Language: English
Number of pages: 514
Weight: 1179g
Height: 273mm
Width: 215mm
Spine width: 25mm