Nanometrology Using the Transmission Electron Microscope

Nanometrology Using the Transmission Electron Microscope

Paperback (30 Oct 2015)

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Publisher's Synopsis

The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.

Book information

ISBN: 9781681740560
Publisher: Morgan & Claypool Publishers
Imprint: IOP
Pub date:
Language: English
Number of pages: 68
Weight: 156g
Height: 256mm
Width: 178mm
Spine width: 10mm