Modern Map Methods in Particle Beam Physics

Modern Map Methods in Particle Beam Physics - Advances in Imaging and Electron Physics

Hardback (22 Sep 1999)

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Publisher's Synopsis

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Book information

ISBN: 9780120147502
Publisher: Elsevier Science
Imprint: Academic Press
Pub date:
DEWEY: 621.367
DEWEY edition: 21
Language: English
Number of pages: 350
Weight: 610g
Height: 229mm
Width: 152mm
Spine width: 21mm