Publisher's Synopsis
This symposium proceedings volume provides the reader with a thorough understanding of the degradation that occurs in the microstructure and mechanical properties of structural and electronic materials resulting from service exposure.;Topic areas discussed include: mechanisms of microstructural degradation resulting from service exposure; effect of microstructural degradation on mechanical behaviour; development of life-prediction methodology for in-service structural and electronic components; experimental techniques to monitor degradation of microstructures and mechanical properties; and the effect of environment on microstructural degradation and mechanical properties.;The book is a collection of papers from the 1995 TMS Annual Meeting and Exhibition in Las Vegas, Nevada, February 12-16, 1995.
