Hardback (01 Apr 1989)
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A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi
| ISBN: | 9780890063507 |
| Publisher: | Artech House Publishers |
| Imprint: | Artech House Publishers |
| Pub date: | 01 Apr 1989 |
| DEWEY: | 621.381 |
| Language: | English |
| Number of pages: | 556 |
| Weight: | 982g |
| Height: | 229mm |
| Width: | 152mm |
| Spine width: | 34mm |
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