Metrology of Optoelectronic Systems

Metrology of Optoelectronic Systems 21-22 May 1987, Orlando, Florida - Proceedings of SPIE--the International Society for Optical Engineering

Paperback (01 Jan 1987)

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Book information

ISBN: 9780892528110
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 621.381045
DEWEY edition: 20
Language: English
Number of pages: 123
Weight: -1g