Materials, Processes, and Reliability for Advanced Interconnects for Micro- And Nanoelectronics - 2011

Materials, Processes, and Reliability for Advanced Interconnects for Micro- And Nanoelectronics - 2011 Symposium Held April 25-29 2011, San Francisco, California, U.S.A - MRS Symposium Proceedings

Hardback (21 Nov 2011)

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Publisher's Synopsis

This volume includes selected papers based on the presentations given at Symposium O, 'Materials, Processes, and Reliability for Advanced Interconnects for Micro- and Nanoelectronics', held at the April 25−29, 2011 MRS Spring Meeting in San Francisco, California. The symposium included topics relating to low-k dielectrics, integration, reliability, metallization, packaging and emerging technologies.

Book information

ISBN: 9781605113128
Publisher: Materials Research Society
Imprint: Materials Research Society
Pub date:
DEWEY: 621.395
DEWEY edition: 23
Language: English
Number of pages: 127
Weight: 360g
Height: 228mm
Width: 152mm
Spine width: 10mm