Print this page
Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology

Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology 6-8 November 2001 [I.e. 2000], Boston, USA - SPIE Proceedings Series

Paperback (12 Feb 2001)

Not available for sale

Includes delivery to the United States

Out of stock

This service is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Check stock

Book information

ISBN: 9780819438546
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 681.25
DEWEY edition: 21
Language: English
Number of pages: 296
Weight: 704g

We recommend

$0.95off

Biometrics

Michael C. Fairhurst

Paperback
Published 20 Nov 2018

Save $0.95

  • RRP $11.54
  • $10.59
Add to basket

$30.09off

Telescopes and Techniques

Kitchin, C. R.

Paperback
Published 20 Oct 2012

Save $30.09

  • RRP $64.19
  • $34.10
Add to basket

$8.57off

Quantum Continuous Variables

Alessio Serafini

Hardback
Published 18 Aug 2023

Save $8.57

  • RRP $111.70
  • $103.13
Add to basket
Photonic Instrumentation

Silvano Donati

Hardback
Published 17 Jul 2023

  • $156.41
Add to basket

$11.04off

Polarization Dynamics of Mode-Locked Fiber Lasers

Sergey V. Sergeyev (...

Hardback
Published 20 Apr 2023

Save $11.04

  • RRP $118.12
  • $107.08
Add to basket

$7.01off

Magnetics, Dielectrics, and Wave Propagation With MATLAB Codes

C. Vittoria

Hardback
Published 15 Nov 2023

Save $7.01

  • RRP $109.13
  • $102.12
Add to basket
Optical Networks

Debasish Datta

Paperback
Published 07 Mar 2023

  • $57.82
Add to basket
Optics of the Human Eye

David A. Atchison, G...

Hardback
Published 31 Mar 2023

  • $170.33
Add to basket

$11.99off

Scanning Probe Lithography

Yu Kyoung Ryu, Javie...

Hardback
Published 22 Dec 2022

Save $11.99

  • RRP $118.12
  • $106.13
Add to basket