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Machine Vision Systems for Inspection and Metrology VIII

Machine Vision Systems for Inspection and Metrology VIII 21-22 September 1999, Boston, Massachusetts - Proceedings of SPIE

Paperback (30 Sep 1999)

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Book information

ISBN: 9780819434296
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 670.425
DEWEY edition: 21
Language: English
Number of pages: 252
Weight: 612g
Height: 273mm
Width: 215mm
Spine width: 12mm

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