MTDT 2009

MTDT 2009 2009 IEEE International Workshop on Memory Technology, Design, and Testing : Proceedings, 31 August- 2 September 2009, Hsinchu, Taiwan

Paperback (01 Jan 2009)

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Book information

ISBN: 9780769537979
Publisher: IEEE Computer Society
Imprint: IEEE Computer Society
Pub date:
DEWEY: 004.568
DEWEY edition: 23
Language: English
Number of pages: 95