Publisher's Synopsis
Excerpt from Laser Beam Profile Measurements Using Spatial Sampling, Fourier Optics, and Holography
We define the potential limits and virtues of the holographic method. In addition, we define limits and virtues of other beam profile techniques such as the two-pinhole scanning method and the Hartmann plate method.
Finally, we indicate possible directions for eventual commercial and scientific exploitation of the holographic method. The technique can be used for near and far-infrared wavelengths and, with appropriate changes in the optics, for visible wavelengths.
Key Words: Amplitude; beam profile; cross correlation; digital sampling; fourier optics; holography; laser; laser parameters; laser pulse; optical processing; phase; precision measurements; wave front.
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