Ion Beams for Materials Analysis

Ion Beams for Materials Analysis

Hardback (05 Feb 1990)

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Publisher's Synopsis

The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A list of books and conference proceedings is given in Table 2. This book is divided into three parts, the first which treats all ion beam techniques and their applications in such diverse fields as materials science, thin film and semiconductor technology, surface science, geology, biology, medicine, environmental science, archaeology and so on.

Book information

ISBN: 9780120997404
Publisher: Elsevier Science
Imprint: Academic Press
Pub date:
Language: English
Number of pages: 719
Weight: 1189g
Height: 229mm
Width: 152mm
Spine width: 41mm